I have been receiving questions lately from people who are puzzled when companies use different parameters than their competitors use to specify the endurance of their SSDs. How do you compare one against the other? Some companies even switch from one parameter to another to define the endurance of different SSDs within their product line.
I have found that Intel uses three different endurance measures for its products: DWPD (drive writes per day), TBW (terabytes written), and GB/day.
There’s not any real difference between any of these measures – each one is one way of stating how many times each of the SSD’s locations can be overwritten before the drive has gone past its warrantied life.
The relationships between these three measures are illustrated in this post’s graphic. You can click on it to see an expanded version. It’s all pretty simple. We’ll spell out the relationships in detail below, but in brief, if you want to compare Continue reading
A new and highly-efficient error correction scheme has recently been revealed by a joint university research team. The SSD Guy has learned that this largely-overlooked research, performed by a cross-university team from University of North by Northeast Wales in the UK (UN-NeW) and Poland’s Trzetrzelewska University, could bring great economies to SSD manufacturers and all-flash array (AFA) companies.
Dr. Peter Llanfairpullguryngyllgogeryohuryrndrodullllantysiliogogogoch of UN-NeW, who generally shortens his name to Llanfairpullguryngyll and Dr. Agnieszka Włotrzewiszczykowycki of Trzetrzelewska University have determined that today’s more standard ECC engines can be dramatically improved upon to both increase available storage for a given price while accelerating throughput. This is achieved through the use of new and highly complex algorithms that differ radically from current ECC approaches that are simply linear improvements upon past algorithms.
According to Dr. Włotrzewiszczykowycki: “The beauty of semiconductors is that Moore’s Law not only allows Continue reading