Extreme SSD Error Correction

Chuo University EmblemAt last week’s International Solid State Circuits Conference (ISSCC) Shuhei Tanakamaru, a researcher from Japan’s Chuo University, detailed a scheme to reduce MLC SSD bit error rates (BER) by 32 times over conventional techniques.  The approach used an impressive combination of mirroring, vertical and horizontal error correction, and a deep understanding of the most likely kinds of bit errors flash will experience.

This is a very novel and well-conceived technique that may find industry adoption in future SSDs.

The steps included in the paper are used in addition to the Continue reading


Jim Handy
Objective Analysis
SSD Market Research
+1 (408) 356-2549
Jim.Handy (at) Objective-Analysis.com

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